商品介绍

AFM 原子力显微镜

最具性价比的AFM 20年的经验,法国CSI研发了这款高性能且负担得起的AFM… Nano-Observer AFM可以提供所有测量模式,且同时适用于高级的应用,具有市面上最强的竞争力及性价比。

各种应用:

  • 半导体
  • 金属
  • 光伏
  • 薄膜&涂层
  • 蛋白质
  • DNA
  • 高分子聚合物



规 格:
    
XY scan range 100 μm (tolerance +/- 10%)
Z range 10 μm (tolerance +/- 10%)
XY drive resolution 24 bit control - 0.06 Angströms
Z drive resolution 24 bit control - 0.006 Angströms
Ultra low noise HV Typ : <0.01 mv="" rms="" td="">0.010.010.01

CSI AFM模式

除了高性能,Nano-Observer同时拥有多种先进的模式,可以扩大你的研究领域。除了contact/LFM and Oscillating/ Phase imaging模式之外,还有多种模式可用於表徵机械粘弹性、样品表面附著力,以及分析电特性(CAFM,ResiScopeTM)、电场(EFM)和磁场(MFM)和表面电位(标准KFMHD-KFMTM)。另外8通道即时成像可提高分析能力。


Nano-Observer具有强大的多功能性:

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High Resolution AFM

The Nano-Observer AFM microscope uses an advanced flat scanning stage to avoid well known defects of the piezoelectric tube scanner such as bow, X-Y crosstalk etc. A low noise feedback control delivers reliable and high performance. A patented flexure stage with 3 independent low voltage piezoelectric devices mounted in a massive platform and combined with a low noise laser and electronics achieves high resolution measurement at atomic scale.

Topography-measurement-of-C36-alkane-deposit-on-HOPG.-Oscillating-mode.-Scan-size-250x250-nm-Nano-Observer-AFM.png
C36, oscillation mode, 250nm


Quality Measurements

Through a smart choice of analog and digital processing, each signal is enhanced to avoid addition of noise and perform a fast feedback. The scanner is controlled by 24-bit D/A converters providing high precision scan to the AFM. A built-in lock-in for accurate topography, phase or MFM/EFM/KFM and PFM measurements is coupled with low noise electronics to acquire highly resolved images and spectroscopy

Topography-measurement-on-DNA-deposit-on-mica.-Oscillating-mode.-Scan-size-1x1-micron-Nano-Observer-AFM.png

DNA, oscillating mode, 800nm



精 志 科 技
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