商品介紹AFM原子力顯微鏡AFM 原子力顯微鏡

AFM 原子力顯微鏡

各種應用:

  • 半導體
  • 金屬
  • 光伏
  • 薄膜&塗層
  • 蛋白質
  • DNA
  • 高分子聚合物



規 格:
    
XY scan range 100 μm (tolerance +/- 10%)
Z range 10 μm (tolerance +/- 10%)
XY drive resolution 24 bit control - 0.06 Angströms
Z drive resolution 24 bit control - 0.006 Angströms
Ultra low noise HV Typ : <0.01 mv="" rms="" td="">0.010.010.01

CSI AFM模式

除了高性能,Nano-Observer同時擁有多種先進的模式,可以擴大你的研究領域。除了contact/LFM and Oscillating/ Phase imaging模式之外,還有多種模式可用於表徵機械粘彈性、樣品表面附著力,以及分析電特性(CAFM,ResiScopeTM)、電場(EFM)和磁場(MFM)和表面電位(標準KFMHD-KFMTM)。另外8通道即時成像可提高分析能力。


Nano-Observer具有強大的多功能性:


High Resolution AFM

The Nano-Observer AFM microscope uses an advanced flat scanning stage to avoid well known defects of the piezoelectric tube scanner such as bow, X-Y crosstalk etc. A low noise feedback control delivers reliable and high performance. A patented flexure stage with 3 independent low voltage piezoelectric devices mounted in a massive platform and combined with a low noise laser and electronics achieves high resolution measurement at atomic scale.


C36, oscillation mode, 250nm


Quality Measurements

Through a smart choice of analog and digital processing, each signal is enhanced to avoid addition of noise and perform a fast feedback. The scanner is controlled by 24-bit D/A converters providing high precision scan to the AFM. A built-in lock-in for accurate topography, phase or MFM/EFM/KFM and PFM measurements is coupled with low noise electronics to acquire highly resolved images and spectroscopy



DNA, oscillating mode, 800nm