商品介绍
首页 商品介绍 功函数量测仪 Kelvin Force Microscopy - 开尔文力显微镜

Kelvin Force Microscopy - 开尔文力显微镜

Work function measurement on Atomic level.
Single pass scanning as new technique on KP-AFM

12f2c32ff1cb31da17c379d3cfb5e92a.png
  1. Single pass scanning on sample. ( No LIFT )
  2. 2 Lock-in device in AFM.
  3. Much higher SENSITIVITY.
  4. Much higher RESOLUTION.
Difference

Standard KFM
68fec17714c4febea771dd8afc3e9ecb.png
HD-KFM

5ea048b66ab7901f2cd0c8fdf2664fa8.png
功函数量测仪 1246566