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Kelvin Force Microscopy - 凱爾文原子力顯微鏡
Work function measurement on Atomic level.
Single pass scanning as new technique on KP-AFM
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Scanning Kelvin probe 掃瞄式功函數量測 (凱爾文探針)
Ambient Advanced Scanning Kelvin Probe for work function measurment
Model: SKP series
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Kelvin probe 單點式功函數量測(凱爾文探針)
Single point Kelvin Probe System for work function measurement
Model: KP mini / KP020
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