-
Kelvin Force Microscopy - 凱爾文原子力顯微鏡
Work function measurement on Atomic level.
Single pass scanning as new technique on KP-AFM
-
Scanning Kelvin probe 掃瞄式功函數量測 (凱爾文探針)
Ambient Advanced Scanning Kelvin Probe for work function measurment
Model: SKP series
-
Kelvin probe 單點式功函數量測(凱爾文探針)
Single point Kelvin Probe System for work function measurement
Model: KP mini / KP020
others
-
Links
Subscribe to Newsletter
-
Browsing site by scanning QR Code