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Kelvin Force Microscopy - 開爾文力顯微鏡
Work function measurement on Atomic level.
Single pass scanning as new technique on KP-AFM
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Scanning Kelvin probe 掃瞄式功函數量測
Ambient Advanced Scanning Kelvin Probe for work function measurment
Model: SKP series
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Kelvin probe 單點式功函數量測
Single point Kelvin Probe System for work function measurement
Model: KP mini / KP020
others
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