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商品介紹功函數量測儀Kelvin Force Microscopy - 凱爾文原子力顯微鏡

Kelvin Force Microscopy - 凱爾文原子力顯微鏡

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  1. Single pass scanning on sample. ( No LIFT )
  2. 2 Lock-in device in AFM.
  3. Much higher SENSITIVITY.
  4. Much higher RESOLUTION.
Difference

Standard KFM

HD-KFM