商品介紹功函數量測儀Kelvin Force Microscopy - 凱爾文原子力顯微鏡 Kelvin Force Microscopy - 凱爾文原子力顯微鏡 =sprice_block= Single pass scanning on sample. ( No LIFT ) 2 Lock-in device in AFM. Much higher SENSITIVITY. Much higher RESOLUTION. DifferenceStandard KFMHD-KFM